The contact method changes setup and cycle economicsFlying probes move between accessible nodes. A dedicated fixture presents many contacts. Neither drawing implies complete defect coverage.The contact method changes setup and cycle economicsMOVING PROBESDEDICATED ICT FIXTUREProgram + supports + measurement timeMany contacts in one fixtureAccess, support and contact integrity³Ô¹Ïtv · Engineering illustration · Not an inspection record